ポスト

Read this article to see how microscopes combining contrast methods, e.g. brightfield, darkfield, polarized light, and UV illumination, enhance semiconductor inspection. During QC of wafers and integrated circuits (ICs), fast and reliable defect detection is achieved.

メニューを開く

Leica Microsystems@LeicaMicro

人気ポスト

もっと見る
Yahoo!リアルタイム検索アプリ